Diagnosis of the Tapping Process by Information Measure and Probability Voting Approach

[+] Author and Article Information
Y. B. Chen

Department of Industrial and Systems Engineering, University of Michigan-Dearborn, Dearborn, MI

J. L. Sha

Department of Mechanical Engineering, University of Wisconsin-Madison, Madison, WI

S. M. Wu

Department of Mechanical Engineering and Applied Mechanics, University of Michigan, Ann Arbor, MI

J. Eng. Ind 112(4), 319-325 (Nov 01, 1990) (7 pages) doi:10.1115/1.2899594 History: Received December 01, 1988; Revised September 01, 1989; Online April 08, 2008


A new method for the diagnosis of the tapping process using the information measure and multiple probability voting scheme is proposed. Considering the features of short cutting-duration and the large uncertainties existing in a tapping process, a set of indices based on the time-domain statistical analysis has been formed. These indices have then been evaluated and ranked using an algorithm that calculates the information gain of each index about the tapping process. The final classification decision can be made by a voting scheme based on the conditional probability functions for multiple indices. Furthermore, the information gains estimated in the index evolution process can be used as a weighting function during voting to improve efficiency and reliability. From a tapping test, which includes five different tapping conditions, a success rate of 95 percent has been achieved.

Copyright © 1990 by The American Society of Mechanical Engineers
Your Session has timed out. Please sign back in to continue.





Some tools below are only available to our subscribers or users with an online account.

Related Content

Customize your page view by dragging and repositioning the boxes below.

Related Journal Articles
Related eBook Content
Topic Collections

Sorry! You do not have access to this content. For assistance or to subscribe, please contact us:

  • TELEPHONE: 1-800-843-2763 (Toll-free in the USA)
  • EMAIL: asmedigitalcollection@asme.org
Sign In