Technical Brief

Virtual Signal-Based Pulse Discrimination in Micro-Electro-Discharge Machining

[+] Author and Article Information
C. K. Nirala

Department of Mechanical Engineering,
Indian Institute of Technology Ropar,
Nangal Road,
Rupnagar 140001, Punjab, India
e-mail: nirala04316@gmail.com

D. R. Unune

Department of Mechanical-Mechatronics Engineering,
The LNM Institute of Information Technology Jaipur,
Rupa ki Nangal,
Via Jamdoli,
Jaipur 302031, Rajasthan, India
e-mail: deepak.unune@lnmiit.ac.in

H. K. Sankhla

Department of Mechanical-Mechatronics Engineering,
The LNM Institute of Information Technology Jaipur,
Rupa ki Nangal,
Via Jamdoli,
Jaipur 302031, Rajasthan, India
e-mail: harshitksankhla@gmail.com

Manuscript received March 2, 2017; final manuscript received June 9, 2017; published online July 17, 2017. Assoc. Editor: Y. B. Guo.

J. Manuf. Sci. Eng 139(9), 094501 (Jul 17, 2017) (7 pages) Paper No: MANU-17-1125; doi: 10.1115/1.4037108 History: Received March 02, 2017; Revised June 09, 2017

Owing to the contaminations in the small discharge gap of micro-electro-discharge machining (μEDM), generation of nonuniform nature of discharge pulses is more significant than in macro-EDM. To address the contribution in material removal of workpiece by each of these pulses, a pulse discriminating (PD) system which discriminates them into contributing and noncontributing types is generally used. Developing a PD system in μEDM is a time-consuming process that requires an availability of continuously running machine. Such requirement could be eliminated if virtual signals, similar to the actual once, are made available and provided continuously to the PD system developer. An innovative idea of generating such virtual signals, based on ni multisim, is, therefore, proposed and a robust PD system based on these signals is developed and validated. The strategy for discriminating the pulses in various types is developed through virtual instrumentation in ni labview. The robustness is validated in terms of its applicability over a wide range of parametric settings, acquisition length, and time.

Copyright © 2017 by ASME
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Grahic Jump Location
Fig. 5

ni labview-developed controls for the μEDM circuit

Grahic Jump Location
Fig. 4

μEDM setup with the NI data acquisition system (left)

Grahic Jump Location
Fig. 3

μEDM-simulated voltage signals

Grahic Jump Location
Fig. 2

μEDM voltage signals captured from an ongoing machining

Grahic Jump Location
Fig. 1

Circuit diagram of a typical μEDM

Grahic Jump Location
Fig. 6

Pulse discrimination at Uo = 90 V and C = 10 nF




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