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Technical Briefs

The Experimental Study on Improved Polishing Method for Terminating Optical Connector

[+] Author and Article Information
Samuel I-En Lin

Department of Power Mechanical Engineering, National Formosa University, Hu-Wei, Taiwan, R.O.C.samlin7@ms41.hinet.net

J. Manuf. Sci. Eng 130(3), 034504 (Jun 03, 2008) (3 pages) doi:10.1115/1.2927438 History: Received October 16, 2006; Revised February 17, 2008; Published June 03, 2008

The growing demand for a wide variety of data communication and telecomunication service requires interconnection devices, such as fiber optic connectors, cable assemblies, and adapters. The strong demands for high performance and cost reduction of these components are thus arising. To ensure connector performance in actual use, several process parameters related to geometric and optical characteristics of the connector must be thoroughly understood during the manufacturing stage. This paper describes an improved polishing technique, which greatly saves production cost and polishing time. A suggested grinding profile for each step is also presented to extend the lifetime cycle on lapping films. The less the number of polishing process involve, the less the geometric imperfection it can produce. By a proper choice of rubber pad hardness and processing conditions, we are able to obtain fiber connectors with 90% overall yield using two-step process.

FIGURES IN THIS ARTICLE
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Copyright © 2008 by American Society of Mechanical Engineers
Topics: Polishing , Fibers
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Figures

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Figure 1

The ferrule geometries (ROC, undercut, and apex offset) measured in four-step process. Total samples are 48 and A-vendor films were used. The geometry yield is 75% and the optical yield is 58%.

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Figure 2

The influence of ferrule geometries among “three-step (denoted as R),” “five-step (denoted as P),” and “three-step using B-supplier’s films (denoted as S).”

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Figure 3

Effects of solution grit size on fiber undercut and optical return loss. All films are from B-supplier. A finer grit size produces less fiber undercut as we expected.

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Figure 4

Effects of film usage on the patch cord yield. The films are continuous used for 15 times with minor time adjustment on Nos. 6, 8, 9, and 10. The results indicate that there is no film degradation before eight times. The patch cord yield starts to fluctuate after eight times of film usage.

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Figure 6

Measured return loss for the PC connectors using enhanced two-step polishing procedure. All tested connectors are within geometric criteria and reflectances are less than −55dB.

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Figure 5

The suggested time profile of each process used in the experiment. The high production yield can remain up to 15 times of film usage.

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