Special Section: Micromanufacturing

Calibration of Palletized Workpiece Systems for Microfactories

[+] Author and Article Information
Andrew Honegger, Shiv G. Kapoor, Richard E. DeVor

Department of Mechanical and Industrial Engineering, University of Illinois at Urbana-Champaign, Urbana, IL 61801

J. Manuf. Sci. Eng 130(3), 031108 (May 12, 2008) (7 pages) doi:10.1115/1.2917289 History: Received August 09, 2006; Revised January 17, 2008; Published May 12, 2008

Kinematic couplings have been used to create palletized system for part transfer in a microfactory. While kinematic couplings provide high repeatability, calibration is needed to achieve high interchangeability accuracy. In this paper, a generalized artifact-based methodology for pallet calibration and workpiece registration is developed. This calibration method uses the microfactory machines to both machine and measure artifacts to estimate the interchangeability errors. The error sources affecting the accuracy of calibration are analyzed and techniques are suggested to reduce these errors. Finally, the methodology is applied and validated for a specific microfactory application.

Copyright © 2008 by American Society of Mechanical Engineers
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Figure 1

Microfactory physical layout (5)

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Figure 2

Three-groove kinematic coupling

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Figure 3

(a) Kinematic base and (b) bottom of sensor pallet

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Figure 6

Measured artifact feature: (a) entire feature, (b) feature edge detail, and (c) feature detection and fitting result

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Figure 7

Calibration and validation features machined in an artifact

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Figure 8

Residuals using compensated error parameters

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Figure 9

Difference between uncompensated and compensated error parameter estimation residuals

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Figure 4

Finite element model of deformed electrical contact

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Figure 5

Machined artifact feature set



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