On the Modeling and Analysis of Machining Performance in Micro-Endmilling, Part I: Surface Generation

[+] Author and Article Information
Michael P. Vogler, Richard E. DeVor, Shiv G. Kapoor

  Department of Mechanical and Industrial Engineering, University of Illinois at Urbana-Champaign, Urbana, IL

J. Manuf. Sci. Eng 126(4), 685-694 (Feb 04, 2005) (10 pages) doi:10.1115/1.1813470 History: Received February 19, 2003; Revised March 30, 2004; Online February 04, 2005
Copyright © 2004 by ASME
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Schematic showing the machined slot with (a) measurement locations 1 and 2 and (b) location of points used to compute Ra
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Effect of feedrate on surface roughness
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Schematics for surface generation prediction: (a) tool geometry profile, (b) tool geometry and minimum chip thickness offset line, (c) generated surface after second tool pass, (d) final generated surface with tool profiles, and (e) final generated surface
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Screen dump of FE simulation with chip thickness (a) below minimum chip thickness and (b) above minimum chip thickness
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Predicted surface profiles for (a) pearlite with 0.5 μm/flute feed, (b) pearlite with 2.0 μm/flute feed, (c) ferrite with 0.5 μm/flute feed, and (d) ferrite with 2.0 μm/flute feed
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Comparison of surface roughness Ra measurements and predictions for ferrite
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Comparison of surface roughness Ra measurements and predictions for pearlite
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Comparison of surface roughness Ra measurements with and without the minimum chip thickness effect
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Two-way diagrams for microstructure analysis
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Ferritic ductile iron Ra measurements and predictions from minimum chip thickness model
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Surface spectra for (a) pearlite, (b) ferrite, (c) ferritic DI, and (d) pearlitic DI
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SEM image of slot floor for (a) pearlite, (b) ferrite, (c) ferritic DI, and (d) pearlitic DI
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SEM image of chips for (a) pearlite, (b) ferrite, (c) ferritic DI, and (d) pearlitic DI
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Graph of effects of minimum chip thickness and burr formation on multiphase Ra values
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Micrographs of (a) ferritic ductile iron and (b) pearlitic ductile iron
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End view of cutting edges with (a) 2.0 μm and (b) 5.0 μm radii
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Photo of experimental setup




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