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TECHNICAL PAPERS

Spatially Resolved Characterization of Residual Stress Induced by Micro Scale Laser Shock Peening

[+] Author and Article Information
Hongqiang Chen, Y. Lawrence Yao, Jeffrey W. Kysar

Department of Mechanical Engineering, Columbia University, New York, NY 10027

J. Manuf. Sci. Eng 126(2), 226-236 (Jul 08, 2004) (11 pages) doi:10.1115/1.1751189 History: Received July 01, 2003; Revised October 01, 2003; Online July 08, 2004
Copyright © 2004 by ASME
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References

Figures

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Typical Laue pattern image: Al (001) single crystal sample
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Shocked line direction with respect to crystalline orientation (Laser pulse energy=300 μJ, pulse duration=50 ns, pulse number=3 at each location, pulse repetition rate=1 KHz, pulse spacing=25 μm)
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Deformed geometry comparison of shocked line for Aluminum sample (a) Measurement of shocked line geometry using AFM (Al, scan area=100×100 μm, data scale=1 μm) (b) FEM simulation of depth deformation (in meter) in shock penned sample. (Al, laser energy=260 uJ, 100 μm in thickness, 250 μm in width, and 500 μm in length, deformation factor=5 for viewing clarity) (c) Comparsion of measured and simulated shocked line profiles for Al sample. Laser beam diameter is 12 microns, pulse duration is 50 ns, laser pulse energy=300 uJ.
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X-ray micro-diffraction measurement arrangement (measurement points are along a line perpendicular to a shocked line, measurements were carried out±100 μm from the center of shocked line, d=5 μm,within±20 μm from the shocked line center, d=10 μm, elsewhere)
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Incident X-ray micro beam profile Full width at half maximum intensity (FWHM)≈0.05°(±0.025°)
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θ  and χ scan of sample/stage
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Spatial distribution of X-ray profile for (002) reflection of Al (001) sample Unsmoothed curve: raw profile, Smoothed curve: fitted profile, Dashed curves: two fitted sub profiles, Vertical line: ideal Bragg angle for Al (002) reflection (Diffraction intensity normalized).
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Detailed view of decomposition of an asymmetric line profile into the sum of two symmetric sub-profiles, diffraction intensity normalized (Sub profile Ic: cell interior; and Sub profile Iw: cell wall)
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Spatial distribution of residual stress in Al (001) sample surface based on the X-ray diffraction measurement
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Measurement scheme II: measuring {222} reflections
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Comparsion of spatial residual stress distribution on sample surface by two X-ray measurement schemes and FEM simulation. (Laser beam diameter is 12 microns, pulse duration is 50ns, laser pulse energy=300 μJ). (a) Al (110) sample (b) Cu (110) sample
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Spatial distribution of X-ray profile for (220) reflection of Al (110) sample Unsmoothed curve: raw profile, Smoothed curve: fitted profile, Dashed curves: two fitted sub profiles, Vertical line: ideal Bragg angle for Al (220) reflection (Diffraction intensity normalized).
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Spatial distribution of X-ray profile for (220) reflection of Cu (110) sample Unsmoothed curve: raw profile, Smoothed curve: fitted profile, Dashed curves: two fitted sub profiles, Vertical line: ideal Bragg angle for Cu (220) reflection (Diffraction intensity normalized).
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Volume fraction ratio of cell wall and cell interior (experimentally determined via dividing areas under sub-profiles Ic and Iw by profile I, respectively)
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Partial dislocation and cross slip formation in FCC metal (a) Partial dislocation direction and magnitude in FCC metal (b) Cross slip formation in FCC metal
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Volume fraction ratio of cell wall and cell interior (experimentally determined via dividing areas under sub-profiles Ic and Iw by profile I, respectively)

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