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TECHNICAL PAPERS

Surface Profile Analysis for Conformable Interfaces

[+] Author and Article Information
Mark C. Malburg

Digital Metrology Solutions, Inc., Columbus, IN 47203

J. Manuf. Sci. Eng 125(3), 624-627 (Jul 23, 2003) (4 pages) doi:10.1115/1.1580851 History: Received December 01, 2002; Online July 23, 2003
Copyright © 2003 by ASME
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References

Malburg, M. C., 1996, A Unified Methodology for the Application of Surface Metrology, University of Warwick & University of North Carolina at Charlotte
Clark,  J. R., and Grant,  M. B., 1992, “The Effect of Surface Finish on Component Performance,” Int. J. Mach. Tools Manuf., 32(1/2), pp. 57–66.
ISO 11562, 1996, “Geometrical Product Specifications (GPS)-Surface texture: Profile method-Metrological characteristics of phase correct filters.”
Radhakrishnan, V., 1971, “On an Appropriate Radius for the Enveloping Circle for Roughness Measurement in the E System,” CIRP Ann., 20 .
Krystek,  M., 1996, “Form Filtering by Splines,” Measurement, 18(1), pp. 9–15.
Brinkmann, S., Bodschwinna, H., Lemke, H.-W., 2000, “Development of a Robust Gaussian Regression Filter for Three-Dimensional Surface Analysis,” X. International Colloquium on Surfaces, Chemnitz.
Srinivasan, V., 1988, “Discrete Morphological Filters for Metrology,” Proceedings of the 6th IMEKO ISMQC Symposium on Metrology for Quality Control in Production, TU Wein, Austria, Sept 8–10.
Scott,  P. J., 1992, “The Mathematics of Motif Combination and Their use for Functional Simulation,” Int. J. Mach. Tools Manuf., 32(1/2), pp. 69–73.

Figures

Grahic Jump Location
A rigid-conformable interface
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The implications of local waviness on sealing or load distribution in a rigid-conformable interface
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A three-domain wavelength separation approach
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Bandpass waviness analysis of a milled surface
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An improved reference profile for conformable surface approximation
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A “closing” operation on a profile using a circular structuring element
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The “void area” for the Fig. 5 data set
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A “good” performing surface (relative void area: 0.448 μm2 /μm). Geometry Reference: Least Squares Line; Filter: Robust Gaussian, 2.5 mm cutoff; Closing Filter Radius: 5000 mm.
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A “poor” performing surface (relative void area: 3.668 μm2 /μm). Geometry Reference: Least Squares Line; Filter: Robust Gaussian, 2.5 mm cutoff; Closing Filter Radius: 5000 mm.

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