3D Double-Vision Inspection Based on Structured Light

[+] Author and Article Information
Guangjun Zhang, Zhenzhong Wei, Xin Li

School of Automation Science and Electrical Engineering, Beijing Univ. of Aeronautics and Astronautics, Beijing 100083, P. R. Chinae-mail: zrb@ns.dept3.buaa.edu.cn

J. Manuf. Sci. Eng 125(3), 617-623 (Jul 23, 2003) (7 pages) doi:10.1115/1.1557292 History: Received October 01, 2001; Revised July 01, 2002; Online July 23, 2003
Copyright © 2003 by ASME
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Grahic Jump Location
Setup of aiming device on 3D translation platform without an angle θ
Grahic Jump Location
Setup of aiming device on 3D translation platform with an angle θ
Grahic Jump Location
Several workpieces and 3D reconstructions
Grahic Jump Location
Principle of structured-light based 3D vision inspection
Grahic Jump Location
Double-directional photoelectric aiming device
Grahic Jump Location
Double-vision 3D vision inspection system



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