3D Double-Vision Inspection Based on Structured Light

[+] Author and Article Information
Guangjun Zhang, Zhenzhong Wei, Xin Li

School of Automation Science and Electrical Engineering, Beijing Univ. of Aeronautics and Astronautics, Beijing 100083, P. R. Chinae-mail: zrb@ns.dept3.buaa.edu.cn

J. Manuf. Sci. Eng 125(3), 617-623 (Jul 23, 2003) (7 pages) doi:10.1115/1.1557292 History: Received October 01, 2001; Revised July 01, 2002; Online July 23, 2003
Copyright © 2003 by ASME
Your Session has timed out. Please sign back in to continue.



Grahic Jump Location
Principle of structured-light based 3D vision inspection
Grahic Jump Location
Double-directional photoelectric aiming device
Grahic Jump Location
Double-vision 3D vision inspection system
Grahic Jump Location
Setup of aiming device on 3D translation platform without an angle θ
Grahic Jump Location
Setup of aiming device on 3D translation platform with an angle θ
Grahic Jump Location
Several workpieces and 3D reconstructions




Some tools below are only available to our subscribers or users with an online account.

Related Content

Customize your page view by dragging and repositioning the boxes below.

Related Journal Articles
Related eBook Content
Topic Collections

Sorry! You do not have access to this content. For assistance or to subscribe, please contact us:

  • TELEPHONE: 1-800-843-2763 (Toll-free in the USA)
  • EMAIL: asmedigitalcollection@asme.org
Sign In