A Predictive Model for Variation in the Pitch Between Stamped Pilot Holes

[+] Author and Article Information
R. Ryan Vallance

Mechanical Engineering, University of Kentucky, Lexington, KY 40506-0108e-mail: vallance@engr.uky.edu

Sepehr Kiani

Development Engineering, Teradyne Connection Systems, Nashua, NH 03060e-mail: skiani@alum.mit.edu

J. Manuf. Sci. Eng 125(2), 384-393 (Apr 15, 2003) (10 pages) doi:10.1115/1.1559158 History: Received February 01, 2002; Revised October 01, 2002; Online April 15, 2003
Copyright © 2003 by ASME
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Grahic Jump Location
Stamped electrical contacts and pitch distance between pilot holes in a carrier strip
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Dieset and press for stamping electrical contacts
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Locating a stamped strip with through-hole pilot pins
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Sequential steps as dieset locates strip and blanks a new pilot hole
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Pin confined within clearance hole
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Uniform joint probability density function for location of pin’s center
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Probability density functions (PDFs) for coordinates (in x direction) of stripper, punch and pilot pins for exemplary dieset
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Errors during piloting operation
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Errors during blanking of pilot holes
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Correlation between locations in (x-direction) of successive pilot holes for sample strip
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Variables in algorithm for estimating pitch variation
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Algorithm for estimating pitch variance  
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Subroutine to calculate variances in hole location and carrier strip location    
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Predicted standard deviation of pitch for 12 pilot pins in exemplary dieset
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Predicted standard deviation of pitch for 16 pilot pins in exemplary dieset
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Predicted standard deviation of pitch for 20 pilot pins in exemplary dieset



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