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TECHNICAL PAPERS

On-Line Chatter Detection Using Wavelet-Based Parameter Estimation

[+] Author and Article Information
Taejun Choi

Graduate Research Assistant

Yung C. Shin

School of Mechanical Engineering, Purdue University, West Lafayette, IN 47907

J. Manuf. Sci. Eng 125(1), 21-28 (Mar 04, 2003) (8 pages) doi:10.1115/1.1531113 History: Received October 01, 2000; Revised February 01, 2002; Online March 04, 2003
Copyright © 2003 by ASME
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References

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Braun,  S., 1975, “Signal Processing for the Determination of Chatter Threshold,” CIRP Ann., 24(1), pp. 315–320.
Rahman,  M., 1988, “In-Process Detection of Chatter Threshold,” ASME J. Ind., 110, pp. 44–50.
Li,  X. Q., Wong,  Y. S., and Nee,  A. Y. C., 1998, “A Comprehensive Identification of Tool Failure and Chatter using a Parallel Multi-ART2 Neural Network,” ASME J. Manuf. Sci. Eng., 120, pp. 433–442.
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Berger,  B. S., Minis,  I., Harley,  J., Rokni,  M., and Papadopoulos,  M., 1998, “Wavelet-based Cutting State Identification,” J. Sound Vib., 213(5), pp. 813–827.
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Figures

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A comparison of wavelet coefficients between stable and unstable turning processes
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(a) Vibration signal under stable cut (b) histogram of the signal and Gaussian probability density function (pdf) with the same mean and standard deviation as in the cutting signal (mean: −0.0382, standard deviation: 2.21)
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Flow chart for implementing the applied algorithm
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Acceleration signals and corresponding chatter indexes. Conventional turning with the 45 deg tool, a spindle speed of 1250 rpm and a feed of 0.0965 mm/rev. (a) depth of cut=1.62 mm (b) depth of cut=2.49 mm (•: estimation point).
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Conventional turning with the same setup as in Fig. 2 (•:estimation point)
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Test points to determine the critical depth of cut at 680 rpm
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FFT plots of x-force signals and estimation of γ at the critical points (•: estimation point)
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Experimental test points (Range 1900–2700 rpm)
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FFT plots of x-force signals and estimation of γ to validate the selected threshold (•: estimation point)
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X-force signals and estimated γ values at test point EE, Y and Z (•: estimation point)

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