Adjusted Least Squares Approach for Diagnosis of Ill-Conditioned Compliant Assemblies

[+] Author and Article Information
Q. Rong

General Electric Corp., Cleveland, OH 44112

J. Shi

Dept. of Industrial and Operations Engineering, The University of Michigan, Ann Arbor, MI 48109e-mail: shihang@engin.umich.edu

D. Ceglarek

Dept. of Industrial Engineering, The University of Wisconsin-Madison, Madison, WI 53706-1572e-mail: darek@engr.wisc.edu

J. Manuf. Sci. Eng 123(3), 453-461 (Mar 01, 2000) (9 pages) doi:10.1115/1.1365116 History: Received August 01, 1999; Revised March 01, 2000
Copyright © 2001 by ASME
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Grahic Jump Location
The MLP layout of an automotive BIW
Grahic Jump Location
The beam structure of the rear doorframe
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The OC curve of type two faults (p1 and p3)
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The OC curves of type one fault (p2 and p4)
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The two-stage assembly model
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The decision flowchart for the isolation of type two faults
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The in-line measurement data of MLP 1 and MLP 2 on the rear door




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