0
TECHNICAL PAPERS

Surface Integrity of Die Material in High Speed Hard Machining, Part 1: Micrographical Analysis

[+] Author and Article Information
T. I. El-Wardany, H. A. Kishawy, M. A. Elbestawi

Intelligent Machines and Manufacturing Research Centre, Department of Mechanical Engineering, McMaster University, Hamilton, Ontario, Canada, L8S 4L7

J. Manuf. Sci. Eng 122(4), 620-631 (Nov 01, 1999) (12 pages) doi:10.1115/1.1286367 History: Received November 01, 1997; Revised November 01, 1999
Copyright © 2000 by ASME
Your Session has timed out. Please sign back in to continue.

References

Figures

Grahic Jump Location
Micrographs of longitudinal mid-section of chips produced by a sharp tool (V=350 m/min,f=0.1 mm/rev,d=0.4 mm,r=1.2 mm, chamfered edge 20°/0.1 mm)
Grahic Jump Location
Micrographs of longitudinal mid-section of chips produced by a worn tool (V=350 m/min,f=0.4 mm/rev,d=0.4 mm,r=1.2 mm, chamfered edge 20°/0.1 mm)
Grahic Jump Location
SEM images of mid-section of chips produced by a tool with 0.5 mm flank wear (V=350 m/min,f=0.1 mm/rev,d=0.4 mm,r=1.2 mm, chamfered edge 20°/0.1 mm)
Grahic Jump Location
Micrographs of chips mid-section produced by tools with flank wear of 0.2 mm (V=350 m/min,f=0.1 mm/rev,r=1.2 mm, chamfered edge 20°/0.1 mm)
Grahic Jump Location
Effect of cutting conditions and tool wear on workpiece surface profile (V=350 m/min,r=1.2 mm, chamfered edge 20°/0.1 mm)
Grahic Jump Location
SEM images of surfaces produced by sharp and worn tools (V=350 m/min,r=1.2 mm, chamfered edge 20°/0.1 mm)
Grahic Jump Location
SEM images of the subsurface layer (V=350 m/min.,f=0.05 mm/rev.,d=0.4 mm,r=1.2 mm, chamfered edge 20°/0.1 mm)
Grahic Jump Location
SEM images of the unetched and etched subsurface layer (V=350 m/min,r=1.2 m, chamfered edge 20°/0.1 mm)
Grahic Jump Location
SEM images of subsurface microstructure (V=350 m/min,f=0.1 mm/rev.,r=1.2 mm, chamfered edge 20°/0.1 mm)
Grahic Jump Location
SEM images showing severe plastic deformation beneath the machined surface (V=350 m/min,r=1.2 mm, chamfered edge 20°/0.1 mm)
Grahic Jump Location
SEM images of the subsurface microstructure (V=350 m/min,f=0.1 mm/rev.,r=1.2 mm, chamfered edge 20°/0.1 mm)

Tables

Errata

Discussions

Some tools below are only available to our subscribers or users with an online account.

Related Content

Customize your page view by dragging and repositioning the boxes below.

Related Journal Articles
Related eBook Content
Topic Collections

Sorry! You do not have access to this content. For assistance or to subscribe, please contact us:

  • TELEPHONE: 1-800-843-2763 (Toll-free in the USA)
  • EMAIL: asmedigitalcollection@asme.org
Sign In