Skew Ray Tracing and Sensitivity Analysis of Geometrical Optics

[+] Author and Article Information
Psang Dain Lin, Te-tan Liao

National Cheng Kung University, Department of Mechanical Engineering, Tainan, Taiwan 70101, R.O.C.

J. Manuf. Sci. Eng 122(2), 338-349 (May 01, 1999) (12 pages) doi:10.1115/1.538924 History: Received November 01, 1998; Revised May 01, 1999
Copyright © 2000 by ASME
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Grahic Jump Location
A surface of revolution forms one medium boundary
Grahic Jump Location
Skew ray tracing at medium boundary surface
Grahic Jump Location
Skew ray tracing in a beam-splitter
Grahic Jump Location
Light refracted through a bi-spherical-convex lens
Grahic Jump Location
Configuration of the surface height measurement system
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The dimensionless system resolutions at different surface heights (1: θ=0°,Φ=−45°,N3=1; 2: θ=0°, Φ=−45°,N3=1/1.5187; 3: θ=0°,Φ=−48°,N3=1/1.5187; 4: θ=0°,Φ=−42°,N3=1/1.5187)
Grahic Jump Location
Sensor readings gX at different surface height and orientation changes (1: θ=−3°,Φ=−48°,N3=1/1.5187; 2: θ=−3°,Φ=−48°,N3=1; 3: θ=0°,Φ=−45°,N3=1; 4: θ=0°,Φ=−45°,N3=1/1.5187)
Grahic Jump Location
The experimental system
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The measured surface height from different models (1: N3=N5=1/1.5187; 2: CMM; 3: N5=1/1.5187,N3=1; 4: triangulation method)



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