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RESEARCH PAPERS

Analysis and Modeling of Surface Waviness Inspection with Light Reflection, Part 2: Back-Lighted Grid Method

[+] Author and Article Information
Ching-Chih Lee

Corporate Technology Center, GenCorp, Inc., 2990 Gilchrist Road, Akron, Ohio 44305-4489

J. Manuf. Sci. Eng 121(4), 785-792 (Nov 01, 1999) (8 pages) doi:10.1115/1.2833145 History: Received April 01, 1996; Revised February 01, 1999; Online January 17, 2008

Abstract

The back-lighted grid method for inspecting a reflective surface has been studied with analytical derivations and numerical modeling. The displacement of the image of a grid point due to surface waviness was found to be proportional to the surface slope along the viewing direction at the reflecting point and the distance between the grid and the reflecting point. The 2-D and 3-D numerical modeling was verified with analytical relations, and the 3-D modeling was then tested with the reflection from a profiled SMC (sheet molding compound) panel. The effects of short-term waviness, light box inclination, viewing angle, and surface waviness orientation are investigated. The reflection image patterns for typical surface features are predicted and characterized.

Copyright © 1999 by The American Society of Mechanical Engineers
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