0
RESEARCH PAPERS

Analysis and Modeling of Surface Waviness Inspection with Light Reflection, Part 1: Laser Beam Scanning Method

[+] Author and Article Information
Ching-Chih Lee

Corporate Technology Center, GenCorp, Inc., 2990 Gilchrist Road, Akron, Ohio 44305-4489

J. Manuf. Sci. Eng 121(4), 778-784 (Nov 01, 1999) (7 pages) doi:10.1115/1.2833144 History: Received April 01, 1996; Revised February 01, 1999; Online January 17, 2008

Abstract

The laser beam scanning method for inspecting a reflective surface has been studied with analytical derivations and numerical modeling. Specular reflection off the surface was assumed and mathematical relations consistent with analytic geometry were used to trace the laser beam and predict its screen projection. It was found that deviation of the screen projection is proportional to the surface slope along the projection direction at the reflecting point and the distance from the point to the screen. The 3-D modeling was validated with 2-D analytical relationship as a special case and was tested with a profiled SMC (sheet molding compound) panel. The screen projections of reflected laser scans off surfaces with typical features of interest are predicted and the effects of waviness orientation are investigated.

Copyright © 1999 by The American Society of Mechanical Engineers
Your Session has timed out. Please sign back in to continue.

References

Figures

Tables

Errata

Discussions

Some tools below are only available to our subscribers or users with an online account.

Related Content

Customize your page view by dragging and repositioning the boxes below.

Related Journal Articles
Related eBook Content
Topic Collections

Sorry! You do not have access to this content. For assistance or to subscribe, please contact us:

  • TELEPHONE: 1-800-843-2763 (Toll-free in the USA)
  • EMAIL: asmedigitalcollection@asme.org
Sign In